Peregrine Semiconductor Corp. based in San Diego, California USA, announced the UltraCMOS® PE4314, a 75-ohm glitch-less RF digital step attenuator (DSA). The new DSA extends the company’s existing glitch-less DSA portfolio to 75 ohms. The PE4314 is perfect for wired broadband applications in infrastructure equipment and cable/satellite customer premises equipment (CPE).
Switching attenuation states with a conventional DSA, causes a brief “glitch” or transient spike in output power, Peregrine notes. The glitch could lead to degraded signal quality and possible damage to power amplifier sub-assemblies.
Peregrine engineers deploy a software or firmware workaround that reduces the effect of this transient spike in their glitch-less DSA. The new DSAs add to Peregrine’s 50-ohm glitch-less DSAs which include the PE43711, the PE43712 and the PE43713. The company says that workaround reduces the output power glitch to less than 0.5 dB. According to Peregrine, the power glitch reduction enables customers to decrease their engineering overhead and prevent damage to expensive sub-assemblies.
The PE4314 is a 75-ohm, 6-bit RF DSA supporting a frequency range from 1 MHz to 2.5 GHz. It is a pin-for-pin compatible upgraded version of the PE43404, PE4304, PE4307, and PE4308 DSAs. The PE4314 covers a 31.5 dB attenuation range in a 0.5 dB step. The DSA can maintain 0.5 dB monotonicity through 2.5 GHz. An integrated digital control interface supports both serial and parallel programming of the attenuation. The initial attenuation state at power up can be programmed. The DSA has an extended operating temperature range up to 105-degrees Celsius and supports 1.8V control voltage.
The PE4314 comes in a 20-lead 4 x 4 x 0.85 mm QFN package. Samples and evaluation kits are available now; volume produced units will be available in March.
Kinana Hussain, director of marketing at Peregrine Semiconductor, commented, “We are now expanding our DSA portfolio to include this 75-ohm solution to solve one of our customers’ biggest challenges—attenuation state transition glitches.”