Aemulus, a Malaysian producer of automated test equipment (ATE), and Peregrine Semiconductor Corp. of San Diego, California USA, have partnered to develop a new microwave frequency tester. The new frequency test system will build on the success of Aemulus’s Amoeba™ AMB7600 RF tester and extend the company’s Amoeba™ testing capabilities to support microwave frequency bands and more complex testing.
“This Aemulus microwave tester is the latest project in a series of successful collaborations with Peregrine Semiconductor,” said Sang Beng Ng, CEO of Aemulus Corporation. “This new tester will not only contribute to growth in test and measurement, but I foresee many opportunities flowing in from other markets with high-frequency demands, such as automotive, radar and 5G wireless. With this strategic partnership, we look forward to duplicating the success of previous collaborative projects.”
￼Aemulus intends to upgrade the Amoeba AMB7600 with key peripheral modules to expand into microwave bands X, Ku, and Ka.
According to Aemulus, the AMB7600 is the world’s first true multi-site, multi-instance RF tester, and it supports RF, digital and analog testing.
While the AMB7600 addresses RF front-end devices, Aemulus says that the new tester will enable the system to meet the rigorous testing needs of radar products and mixers. Peregrine says it plans to integrate the new tester, which is currently in design development, into its test infrastructure in fall 2016 and expects to have full implementation by spring 2017.
“As the market demand for high-frequency products increases, Peregrine has responded with a robust high-frequency product portfolio and has set new records for SOI at microwave frequencies,” says Carl Tulberg, principal engineer, NPI operations at Peregrine Semiconductor. “But this innovation must be supported by a sophisticated test infrastructure and that boils down to the right test equipment. This Aemulus partnership aligns with our product roadmap and ensures we meet our microwave test equipment needs today and in the future.”